From Sand to Superintelligence · Drill cards · Chapter 11
Drills
Test and Dice
10 atomic recall cards. Export to Anki and let spaced repetition do its slow work.
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| Front | Back |
|---|---|
| What machine physically touches the die pads to run wafer-level tests? | A wafer prober, which uses a probe card studded with fine gold-plated tungsten or MEMS needles. |
| Roughly how many distinct tests does probe run on a complex chip like Rubin? | Hundreds or thousands of distinct tests. |
| What are 'scribe lines' on a wafer? | Channels in the silicon between dies along which the dicing saw or laser cuts to singulate the individual chips. |
| What is 'yield' in wafer manufacturing? | The fraction of working dies on a finished wafer. |
| What is a typical yield range for leading-edge logic at the start of production? | 50–80% is typical; early in production, even 50% would not be surprising for a reticle-limit die like Rubin. |
| How much does a 300 mm Rubin wafer cost to produce, approximately? | Perhaps $20,000. |
| What is the approximate cost per known-good Rubin die? | Around $10,000. |
| What happens to a die that fails one functional block but passes otherwise? | It may be binned and sold as a lower-tier product with that block disabled — a recoverable failure rather than a discard. |
| What is a 'performance bin' in wafer test? | A category assigned to a passing die based on its maximum reliable clock speed and functional completeness. |
| What comes after dicing for a Rubin GPU die, making it only 'halfway' to finished? | Advanced packaging — integrating the GPU die with stacks of high-bandwidth memory on a silicon interposer. |